CControls Blog

Keysight Pro XG7 Analog Signal Generators

Written by CControls Team | 05.10.2026, 13:15:35

Keysight Pro XG7:

Increase RF Test Performance and Measurement Confidence

 

Metrology-grade signal generation for demanding RF and microwave applications

In advanced RF and microwave testing, the signal source is a critical part of the measurement chain. Phase noise, harmonics, spurious content and insufficient output power can directly influence measurement accuracy and limit how clearly engineers can evaluate the device under test (DUT).

The Keysight Pro XG7-class analog signal generators are designed for demanding calibration, research and poduction test environments where signal quality, repeatability and measurement confidence matter.

The Pro XG7 class includes the SG6311A, E8257D and E8663D PSG signal generators, covering a broad range of precision RF and microwave requirements. Across the portfolio, Keysight combines metrology-grade performance with high spectral purity, high output capability and frequency coverage up to 67 GHz, extendable to 1.1 THz with external frequency extenders.

 

Key capabilities of the Pro XG7 class:

  • Frequency coverage up to 67 GHz (E8257D)
  • Extension up to 1.1 THz with external frequency extenders (E8257D)
  • Up to 1 W (+30 dBm) of RF power with the optional high-power extension (E8257D), and calibrated output power up to +22 dBm (SG6311A)
  • Low phase noise, harmonics and spurious content
  • Metrology-grade accuracy for precision measurements
  • Support for clean CW signals through to complex analog modulated signals

The result is a signal generation platform designed to provide cleaner stimuli, greater measurement confidence and more flexibility across demanding RF applications.

 

 

Reveal more of the true DUT performance

Signal purity becomes increasingly important as measurements approach the performance limits of the device under test. Phase noise, harmonics and spurious signals generated by the source can mask low-level behaviour or become part of the measured result. The Pro XG7 class is designed to minimise this source contribution.

For example, the SG6311A reaches phase noise down to −153 dBc/Hz at 1 GHz with a 20 kHz offset, with harmonics down to −55 dBc at 1 GHz. This enables engineers to work with a cleaner RF reference and preserve visibility into the behaviour of the DUT.

 

This is especially relevant for applications such as:

  • RF and microwave component characterisation
  • Communication receiver testing
  • Radar development
  • Satellite communications
  • ADC and DAC evaluation
  • Calibration and metrology
  • Advanced RF research
  • 5G and 6G development

 

 

Three Pro XG7 models for different measurement requirements

The Pro XG7 family provides different configurations depending on the frequency range, channel requirements and performance priorities of the application.

 

 

SG6311A Pro XG7

The SG6311A is designed for applications where low source noise, higher test density and multiple RF paths are important.

It provides frequency coverage up to 20 GHz, two independent RF outputs and phase noise down to −153 dBc/Hz at 1 GHz with a 20 kHz offset. The instrument integrates these capabilities into a compact 2U platform, with calibrated output power of up to +22 dBm. For automated and multi-channel test environments, this can help increase test capacity while reducing the number of individual signal sources required.

The SG6311A is especially relevant for precision measurements, high-speed converter testing, calibration and advanced RF research, where the source contribution to the measurement needs to remain as low as possible. It also fits environments where clean, calibrated output power and compatibility with existing automated test setups (SCPI) are important.

 

 

 

 

E8257D PSG

The E8257D addresses applications that require significantly higher microwave frequency coverage.

It operates from 100 kHz to 67 GHz and combines high output power, level accuracy, low phase noise and modulation capability. At 1 GHz, Keysight specifies phase noise of −143 dBc/Hz at a 20 kHz offset and harmonics of −55 dBc (values depend on the selected configuration and options).

Its extended frequency range makes it particularly suitable for advanced RF and microwave radar, satellite communication and high-frequency component testing. With external frequency extenders, the E8257D can also support signal generation up to 1.1 THz, opening the path toward millimetre-wave and sub-THz applications.

 

 

 

 

 

E8663D PSG

The E8663D complements the Pro XG7 family for applications where signal purity and particularly low phase noise are key measurement requirements.

It tunes from 100 kHz to 9 GHz (configurations are available for 3.2 GHz and 9 GHz) and delivers phase noise of −143 dBc/Hz at 1 GHz with a 20 kHz offset, harmonics of −55 dBc and 21 dBm output power at 1 GHz. Keysight positions it as the lowest phase noise signal generator commercially available, which makes it a strong choice as a reference in phase noise test systems, for ADC testing, and wherever a low-noise local oscillator is required.

Its high spectral purity and level accuracy suit demanding radar and satellite communications measurements, as well as calibration, metrology and receiver testing. AM, FM, phase and pulse modulation can be added to characterise devices and circuits. Because the E8663D is code compatible with the earlier 8663A, existing automated test setups can be reused.

Together, the three models allow engineers to select the Pro XG7 configuration that best matches the actual test challenge rather than relying on a single general-purpose source.

 

Extend test capability up to 67 GHz and beyond

Modern radar, satellite and wireless systems continue to move toward higher frequencies. With the E8257D, the Pro XG7 class provides frequency coverage up to 67 GHz, while external frequency extension enables operation up to 1.1 THz. This gives engineering teams a path from conventional RF and microwave testing into millimetre-wave and sub-THz applications.

For emerging technologies such as 6G research, very-high-frequency radar and advanced satellite communications, this additional frequency headroom can support both current and future measurement requirements.

 

Overcome losses in complex RF test setups

Real-world RF signal paths include cables, switches, fixtures, attenuators and other components that introduce loss before the signal reaches the DUT.

The Pro XG7 class offers high output power: the SG6311A delivers calibrated power of up to +22 dBm, and the E8257D reaches up to 1 W (+30 dBm) with the high-power extension. Higher available source power can help compensate for these losses and reduce the need for additional external amplification.

 

For engineering teams, this can mean:

  • Fewer external components
  • Simpler RF signal paths
  • Reduced integration effort
  • Fewer components requiring calibration
  • More usable signal power at the DUT

 

The benefit is not simply higher power. It can also simplify the overall measurement architecture and improve repeatability.

 

Metrology-grade performance for precision measurements

For calibration and precision test environments, raw performance alone is not enough. Measurements also need to be accurate, repeatable and supported by a stable reference.

Keysight positions the Pro XG7 class as its metrology-grade analog signal generation platform for demanding applications in calibration laboratories, research environments and production testing. Low phase noise, harmonics and spurious content help reduce the contribution of the source to the overall measurement uncertainty.

That becomes particularly important when characterising high-performance RFICs, receivers, oscillators, converters and other devices where small-signal behaviour needs to remain visible.

 

Flexible signal generation for different RF applications

Different applications require different types of stimulus. The Pro XG7 class supports signals ranging from clean continuous-wave tones to complex analog modulated signals.

 

Combined with broad frequency coverage, high output power and spectral purity, this enables the family to support a wide range of tasks across:

  • Research and development
  • Calibration laboratories
  • Production testing
  • Radar and aerospace applications
  • Satellite communications
  • RF and microwave component testing
  • Advanced wireless development

The objective is not simply to generate a signal. It is to provide a signal reference that allows the measurement system to reveal the actual performance of the DUT.

 

Build greater confidence into every RF measurement

 

The performance of a signal generator should not be judged by one specification alone. Its value comes from how those specifications work together:

  • Low phase noise helps preserve visibility into weak device behaviour.
  • Low harmonics and spurious content reduce unwanted source influence.
  • High output power helps compensate for losses in complex signal paths.
  • Broad frequency coverage extends the usable measurement range.
  • Metrology-grade performance provides the stable reference required for precision testing.

The Keysight Pro XG7-class analog signal generators, including the SG6311A, E8257D and E8663D, bring these capabilities together for demanding RF and microwave applications.

The result: cleaner stimulus, greater measurement confidence and a clearer view of the true performance of the device under test.

 

Explore the Keysight Pro XG7 class

Discover how the Keysight Pro XG7-class analog signal generators can support your RF, microwave, calibration and research applications.

 

Talk to our Computer Controls Test & Measurement specialists about your signal generation requirements.