A Technical Overview of Integrated Photonics Test Products
Integrated photonics, also known as silicon photonics, is transforming various industrial segments such as intra-data centre communication, data centre interconnections (DCI), telecom, 5G, automotive connectivity, high-performance computing, LIDAR, sensing, and medical applications. Efficient testing solutions are crucial for the advancement of these technologies.
Integrated Photonics Explained
Definition and Components
Integrated photonics involves the integration of optical components on a single chip, typically using silicon as the base material.
Advantages
Higher data rates, reduced power consumption, and scalability compared to traditional electronic components.
Applications
Key applications include data centre communication, telecom networks, automotive sensors, and medical devices.
Testing Challenges in Integrated Photonics
Wafer-Level Testing
Efficient wafer-level testing is essential due to the integration of various optical components on a single chip.
Device Integration
Higher data rates and integration levels add complexity to testing.
Multi-Die Designs
The transition from packaged devices to multi-die designs requires new testing approaches.
Access for Testing
Integrated devices may limit access for testing, requiring new methodologies.
Keysight's Testing Solutions
Wavelength and Polarization-Dependent Measurements
Utilizes tunable laser sources, polarization synthesizers, multiport power meters, and source measurement units with application software.
RF Testing
Conducted using Keysight’s lightwave component analyzer.
Automated Wafer Probing
FormFactor probe station is used for automated wafer probing.
High-Speed Digital Design
Analyzed using ADS software.
O/E and E/O Design Analysis
Supports high-frequency measurements up to 67 GHz and beyond.
Related Application Note: On-Wafer Testing of Opto-Electronic Components
This application note describes the process and benefits of on-wafer testing for optoelectronic components, particularly using the N437xD/E Lightwave Component Analyzer. It emphasizes the importance of precise calibration and measurement techniques for accurate S-parameter measurements, both single-ended and balanced.
Test Automation
PathWave Test Automation Platform (TAP)
Includes test recipes, measurement plan definition, and execution.
Automated Photonic Application Suite
Integrated with TAP plug-ins for streamlined testing.
Wafer Prober Plugin
N7700210C plugin for automated wafer probe station control.
LCA Measurement Plugin
N4370P01A plugin for automated O/E and E/O measurements.
Wafer Manufacturing Test Solutions
One-Stop Integrated Solution
Provides a fully-automated wafer probing system.
High-Throughput Testing
Designed for volume production with guaranteed system performance.
Related Application Note: Wafer and Chip-Level Optical Test
This application note highlights the significance of wafer-level testing in the production of photonic integrated circuits. It discusses the need for early-stage parametric tests to ensure device quality and performance, covering electrical and optical measurements including RF-frequency dependence.
Instrument Workflow Software Comparison
Keysight offers various hardware, software, and service bundles to meet specific testing needs:
Efficient testing is critical for the development and deployment of integrated photonics technologies. Keysight's comprehensive solutions enable precise and automated testing, supporting innovation and efficiency in this field. For more information or to explore specific solutions, contact our sales team.
